Meet Eumetrys at CS Mantech 2025 in New Orleans – Booth 707

Join the global compound semiconductor community at CS Mantech
May 19–21, 2025 | New Orleans, LA, USA | Booth #707
Join the global compound semiconductor community at CS Mantech
From May 19 to 21, 2025, the global compound semiconductor industry will gather at CS Mantech 2025 in New Orleans – one of the most prominent events in the field. Eumetrys will proudly host booth #707 and showcase its advanced solutions in particle inspection and cleanroom robotics.
We look forward to welcoming our customers, partners, and industry peers for engaging discussions and tech demos – all over a good cup of coffee!
Innovative solutions for compound semiconductor fabs
At CS Mantech, we will highlight two key areas of expertise that support productivity and precision in microelectronics manufacturing:
YGK – Reliable Particle Inspection for Critical Substrates
Laser Scanning particle inspection for unpatterned substrates: Silicon, SiC, Sapphire, and Glass.
Featuring the YPI system from YGK, exclusively distributed by Eumetrys.
Optimized for surface inspection of both opaque and transparent wafers (SiC, GaN, InP, Silicon, Glass).
A robust, cost-effective solution for compound semiconductor production lines.
Eumetrys Robotics – Legacy Robots, Reinvented
Services include refurbishment, standard exchange, and buy-out programs for cleanroom robots.
Compatible with major brands: PRI, Brooks, Rorze, Asyst, and more.
Designed to help fabs achieve cost-efficiency and operational reliability.
Schedule a meeting with our team
Our experts will be on site to guide you through technical discussions and explore your specific needs:
Paul Knutrud – USA Sales Director
pknutrud@eumetrys.com
Surface Scanners & Robotics
Alexandre Van de Walle – Sales Account Manager & Application Expert
avandewalle@eumetrys.com
Surface Scanners & Photoluminescence
Charan Nichenametla – Application Expert
cnichena@eumetrys.com
Surface Scanners & Photoluminescence
Let’s shape the future of semiconductor manufacturing – together
Whether you're looking for the right particle scanner for SiC wafers, need a solution to improve fab performance, or want expert advice on surface inspection and photoluminescence, Eumetrys is here to help.
Contact us today to schedule a personal meeting at the show.
www.eumetrys.com
www.eumetrys-robotics.com
Follow us on LinkedIn and turn on notifications for our latest updates!
Join the global compound semiconductor community at CS Mantech
From May 19 to 21, 2025, the global compound semiconductor industry will gather at CS Mantech 2025 in New Orleans – one of the most prominent events in the field. Eumetrys will proudly host booth #707 and showcase its advanced solutions in particle inspection and cleanroom robotics.
We look forward to welcoming our customers, partners, and industry peers for engaging discussions and tech demos – all over a good cup of coffee!
Innovative solutions for compound semiconductor fabs
At CS Mantech, we will highlight two key areas of expertise that support productivity and precision in microelectronics manufacturing:
YGK – Reliable Particle Inspection for Critical Substrates
Laser Scanning particle inspection for unpatterned substrates: Silicon, SiC, Sapphire, and Glass.
Featuring the YPI system from YGK, exclusively distributed by Eumetrys.
Optimized for surface inspection of both opaque and transparent wafers (SiC, GaN, InP, Silicon, Glass).
A robust, cost-effective solution for compound semiconductor production lines.
Eumetrys Robotics – Legacy Robots, Reinvented
Services include refurbishment, standard exchange, and buy-out programs for cleanroom robots.
Compatible with major brands: PRI, Brooks, Rorze, Asyst, and more.
Designed to help fabs achieve cost-efficiency and operational reliability.
Schedule a meeting with our team
Our experts will be on site to guide you through technical discussions and explore your specific needs:
Paul Knutrud – USA Sales Director
pknutrud@eumetrys.com
Surface Scanners & Robotics
Alexandre Van de Walle – Sales Account Manager & Application Expert
avandewalle@eumetrys.com
Surface Scanners & Photoluminescence
Charan Nichenametla – Application Expert
cnichena@eumetrys.com
Surface Scanners & Photoluminescence
Let’s shape the future of semiconductor manufacturing – together
Whether you're looking for the right particle scanner for SiC wafers, need a solution to improve fab performance, or want expert advice on surface inspection and photoluminescence, Eumetrys is here to help.
Contact us today to schedule a personal meeting at the show.
www.eumetrys.com
www.eumetrys-robotics.com
Follow us on LinkedIn and turn on notifications for our latest updates!